◆ Patents ◆
- Applied Patent: 2013-009935
Charge storage type solar electrical generator and solar electrical system
- Applied Patent: 2012-059935
Manufacturing method of the stacked solar cell
- Applied Patent: 2012-034288
Processing method of the semiconductor substrate
- Applied Patent: PCT/JP2012/052464
Solar battery and its manufacturing methods
- Applied Patent: 2011-276215
Measuring methods of the photo-induce carrier life time and its measuring system
- Applied Patent: 2011-068760
Series connection solar cell and solar cell system
- Open Patent: 2013-21095
Solar battery and its manufacturing methods
- Open Patent: US2012-0077331
Thin film semiconductor substrate manufacturing method
- Open Patent: 2012-069817
Thin film semiconductor substrate manufacturing method
- Open Patent: 2012-069538
Semiconductor solar cell and its manufacturing method
- Open Patent: 2011-210766
Solar cell junction method and junction type solar cell system
- Open Patent: 2011-187603
Heat treatment method for semiconductor material and semiconductor laser beam shielding plate
- Open Patent: 2011-187603
Defect reduction method for semiconductor substrate and manufacturing method for thin film transistor
- Open Patent: 2010-003834
Impurity doping method for Semiconductor used for solar power generation
- Open Patent: 2009-158883
Thin film semiconductor substrate and its manufacturing method
- Open Patent: 2009-117404
Thin film semiconductor substrate and its manufacturing method
- Open Patent: 2009-117403
Gate insulator film, thin film transistor substrate and its manufacturing method
- Open Patent: 2008-147578
Measurement method for crystallization rate and measurement system
- Open Patent: 2008-124083
Measurement method for crystallization rate and measurement system
- Open Patent: 2008-051662
Measurement method for absolute reflectivity and measurement system
- Open Patent: 2007-334275
Low cost wide screen wide view angle high speed reply liquid crystal display drive
- Open Patent: 2007-310334
Manufacturing method for liquid crystal display using half tone light exposure method
- Open Patent: 2007-150223
Functional substrate and its manufacturing method and stripping layer removal method
- Open Patent: 2007-115927
Heat treatment method
- Open Patent: 2007-115926
Thermal head and heat treatment system
- Open Patent: 2007-115769
Electrical characteristic measurement system
- Open Patent: 2006-281189
Ink-jet coating solution and drying method
- Open Patent: 2006-253440
Manufacturing method of the semiconductor device and semiconductor devices
- Open Patent: 2006-216891
Manufacturing method of the thin film element structure and functional substrate for the thin film element structure
- Open Patent: 2005-317801
Formation of the thin film element
- Open Patent: 2005-285380
Diode element and its used device
- Open Patent: 2002-289520
Pulse electricity heat treatment method with the thin film heating element and
- Open Patent: 2002-200599
Manufacturing method of three-dimensional structure
- Open Patent: 2001-334499
Manufacturing method of the micro device
- Open Patent: 2001-237190
Multi crystalline silicon thin film and its formation method
- Open Patent: 2001-223361
Manufacturing method of the field effect transistor
- Open Patent: 2001-060690
Manufacturing method of thin film transistor
- Open Patent: 2000-277579
Method for test crystallinity of semiconductor thin film
- Open Patent: 2000-277451
Semiconductor manufacturing system
- Open Patent: 1999-097438
Reforming method of the silicon oxide
- Open Patent: 1999-097357
Formation method of the semiconductor element
- Open Patent: 1999-097350
Hear treatment method for the semiconductor film
- Open Patent: 1998-163109
Optical beam annealing method
- Open Patent: 1997-246184
Manufacturing method of the semiconductor device
- Open Patent: 1997-148287
Storage method of the substrate, process method of the substrate and formation method of the thin film
- Open Patent: 1996-274090
Formation method of the insulator
- Open Patent: 1996-204205
Manufacturing method of the bottom gate type thin film transistor
- Open Patent: 1996-192284
Control method of the optical beam
- Open Patent: 1996-167596
Plasma processing system, plasma processing method and manufacturing method of the semiconductor device
- Open Patent: 1996-055988
Formation method of the gate insulation film
- Open Patent: 1996-055858
Manufacturing method for semiconductor device
- Open Patent: 1996-045858
Plasma processing system
- Open Patent: 1995-335880
Formation method of the insulation film, manufacturing method of the semiconductor device and semiconductor device
- Open Patent: 1995-326665
Manufacturing method of the SIO substrate and semiconductor device
- Open Patent: 1995-288246
Manufacturing method of processing mask, substrate processing method and manufacturing method of quantum box density element
- Open Patent: 1995-249778
Display element driver and it manufacturing method
- Open Patent: 1995-245311
Heating system, heating method and manufacturing semiconductor device
- Open Patent: 1995-225079
Heating method and manufacturing method of the semiconductor device
- Open Patent: 1995-201876
Heating method, heating system, and manufacturing method of the semiconductor device
- Open Patent: 1995-176763
Field effect transistor
- Open Patent: 1995-147259
Manufacturing method for thin film transistor
- Open Patent: 1995-140429
Optical shatter and its manufacturing method
- Open Patent: 1995-099321
Manufacturing method of the thin film semiconductor element and manufacturing device
- Open Patent: 1995-094739
Field effective transistor with quantum box and its manufacturing method
- Open Patent: 1995-094705
Quantum box density element and its manufacturing method
- Open Patent: 1995-086160
Manufacturing method of semiconductor device
- Open Patent: 1995-058342
Manufacturing method of the thin film transistor
- Open Patent: 1995-058341
Manufacturing method of the thin film transistor
- Open Patent: 1995-050257
Manufacturing method of semiconductor device
- Open Patent: 1995-0307817
Prove for plasma measuring and its used plasma measuring method
- Open Patent: 1995-005311
Optical mirror system
- Open Patent: 1994-291034
Heat treatment method for thin film
- Open Patent: 1994-275650
Manufacturing method of the field effect transistor
- Open Patent: 1994-244255
Semiconductor phase conversion monitor method and its used semiconductor crystalline method
- Open Patent: 1994-244202
Manufacturing of the semiconductor device
- Open Patent: 1994-236975
Multi-function board for semiconductor system and manufacturing method of the semiconductor element
- Open Patent: 199-236850
Plasma processing system
- Open Patent: 1994-232117
Formation method of the insulation film and manufacturing semiconductor device
- Open Patent: 1994-177142
Manufacturing method of the transistor
- Open Patent: 1994-168876
Formation method of the semiconductor crystalline and semiconductor element
- Open Patent: 1994-140422
Manufacturing method of the electric field effect transistor
- Open Patent: 1994-018330
Optical-absorption coefficient measuring method and optical-absorption coefficient measuring system
- Open Patent: 1994-013356
Method of the thin film pattern formation
- Open Patent: 1993-343545
Method of the film modification
- Open Patent: 1993-335255
Method of the film formation
- Open Patent: 1993-334881
Phase transition type memory media and phase transition type memory method
- Open Patent: 1993-326369
Patterning system
- Open Patent: 1993-307157
Display system
- Open Patent: 1993-291220
Manufacturing method of the semiconductor device
- Open Patent: 1993-283691
Thin film transistor and its manufacturing method
- Open Patent: 1993-167012
Semiconductor system
- Open Patent: 1993-121800
Laser system
- Open Patent: 1993-090587
Insulation gate type of the electric field effect transistor
- Open Patent: 1993-062899
Formation method of the semiconductor thin film
- Open Patent: 1993-036721
Manufacturing of the electric field effect transistor
- Open Patent: 1993-028532
Optical memory media
- Open Patent: 1993-021393
Plasma processing system
- WO2006/098513
Method of the heat treatment and crystalline for semiconductor
- WO2006/022425
Electrical characteristic measuring system for semiconductor
- WO00/060652
Formation method of the thin film substrate and its formed by thin film substrate
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